An approximate multi-beam form of the ''ellipse'' in high-resolution transmission electron microscopy

By Hu J.J.   Tanaka N.  

Ultramicroscopy, Vol. 74, Iss. 3, 1998-08 ,pp. : 105-111

Elsevier

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Lowering the limit of detection in high spatial resolution electron beam microanalysis with the microcalorimeter energy dispersive X-ray spectrometer

By Newbury D.   Wollman D.   Irwin K.   Hilton G.   Martinis J.  

Ultramicroscopy, Vol. 78, Iss. 1, 1999-06 ,pp. : 73-88

Elsevier

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Optimum condition of convergent beam illumination for observation of local structure by high resolution transmission electron microscopy

By Mitome M.   Takayanagi K.  

Ultramicroscopy, Vol. 62, Iss. 1, 1996-01 ,pp. : 123-131

Elsevier

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Efficient beam-selection criteria in quantitative convergent beam electron diffraction

By Birkeland C.   Holmestad R.   Marthinsen K.   Hoier R.  

Ultramicroscopy, Vol. 66, Iss. 1, 1996-11 ,pp. : 89-99

Elsevier

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Measurement of Coulomb interactions in an electron beam monochromator

By Tiemeijer P.C.  

Ultramicroscopy, Vol. 78, Iss. 1, 1999-06 ,pp. : 53-62

Elsevier

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