Observation of Domain Structures in Bi-Based CaBi 4 Ti 4 O 15 Thin Films by Scanning Force Microscopy

Author: Fu Desheng   Suzuki Kazuyuki   Kato Kazumi  

Publisher: Taylor & Francis Ltd

ISSN: 0015-0193

Source: Ferroelectrics, Vol.291, Iss.1, 2003-01, pp. : 49-54

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