A New Method for Electrical Characterization of Ferroelectric Thin Films at Microwave Frequencies

Author: Subramanyam Guru  

Publisher: Taylor & Francis Ltd

ISSN: 0015-0193

Source: Ferroelectrics, Vol.356, Iss.1, 2007-01, pp. : 153-157

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract