Author: Sene Anais
Publisher: Taylor & Francis Ltd
ISSN: 0015-0193
Source: Ferroelectrics, Vol.372, Iss.1, 2008-01, pp. : 41-46
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Temperature Dependence of the Critical Size of Ferroelectric Thin Films
By Wang X. S. Wang C. L. Zhong W. L. Xue X. Y.
Ferroelectrics, Vol. 282, Iss. 1, 2003-01 ,pp. :
Ferroelectric Domains in Thin Films and Superlattices: Results of Numerical Modeling
Ferroelectrics, Vol. 359, Iss. 1, 2007-11 ,pp. :
MOCVD of ferroelectric thin films
Le Journal de Physique IV, Vol. 09, Iss. PR8, 1999-09 ,pp. :