Author: Meikrantz D. H. Macaluso L. L. Flim W. D. Heald C. J. Mendoza G. Meikrantz S. B.
Publisher: Taylor & Francis Ltd
ISSN: 0098-6445
Source: Chemical Engineering Communications, Vol.189, Iss.12, 2002-12, pp. : 1629-1639
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Abstract
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