Analysis of ultrathin Ge layers in Si by large angle convergent beam electron diffraction

Author: Hovsepian A.   Cherns D.   Jaeger W.  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.79, Iss.6, 1999-06, pp. : 1395-1410

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content