High-resolution quantitative X-ray microanalysis of Nb/Al multilayer thin films using the zeta-factor approach

Author: Lucadamo G.   Watanabe M.   Barmak K.   Williams D. B.   Michaelsen C.   Alani R.  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.79, Iss.6, 1999-06, pp. : 1423-1442

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Abstract