Atomic-scale quantitative elemental analysis of boundary layers in a SrTiO 3 ceramic condenser by high-angle annular dark-field electron microscopy

Author： Kawasaki Masahiro   Yamazaki Takashi   Sato Shigeki   Azutowatanabe K   Shiojiri Makoto  

Publisher： Taylor & Francis Ltd

ISSN： 0141-8610

Source： Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.81, Iss.1, 2001-01, pp. : 245-260

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