Transmission electron microscopy analysis of planar faults on (001) planes in MoSi 2 single crystals

Author: Guder Susanne   Bartsch Martin   Rschmidt Ulrich Messe  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.82, Iss.14, 2002-09, pp. : 2737-2754

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content