

Author: Zhang Tong-Yi Wang Tian-Hong Zhao Ming-Hao
Publisher: Taylor & Francis Ltd
ISSN: 0141-8610
Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.82, Iss.15, 2002-10, pp. : 2805-2824
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Abstract
The electrical and mechanical fields induced by a piezoelectric screw dislocation near an electrically insulating elliptical cavity in a piezoelectric material are derived through the image dislocation approach by considering the electric field inside the cavity. When the cavity is reduced to a crack, three outcomes are possible. The three outcomes correspond to three different electrical boundary conditions along the crack faces, depending on the α/ ratio, where α is the ratio of the minor semiaxis to the major semiaxis of the ellipse and is the ratio of the dielectric constant of the cavity to the effective dielectric constant of the piezoelectric material. The crack is electrically impermeable when α/ → ∞; the crack becomes electrically permeable as α/ → 0. Since the minimum of the dielectric constant has a finite non-zero value and a real crack also has a non-zero width, the α/ ratio will generally have a finite non-zero value, resulting in a semi-impermeable crack. Furthermore, the difference in the electric boundary conditions leads to great differences in the image force acting on the dislocation, in the intensity factors and in the J integral for crack propagation induced by the dislocation.
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