Author: Borchers C. Michaelsen C.
Publisher: Taylor & Francis Ltd
ISSN: 0141-8610
Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.82, Iss.6, 2002-04, pp. : 1195-1205
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Non-contact measurement of conductivity during growth of metal ultrathin films
By Fahsold G. Priebe A. Magg N. Pucci A.
Thin Solid Films, Vol. 428, Iss. 1, 2003-03 ,pp. :