TRANSIENT, INTERFEROMETRIC IMAGING OF POLYCRYSTALLINE SILICON MEMS DEVICES DURING LASER HEATING

Author: Rogers James  

Publisher: Taylor & Francis Ltd

ISSN: 1091-7640

Source: Microscale Thermophysical Engineering, Vol.8, Iss.1, 2004-01, pp. : 43-59

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract