Author: Song Bongsub Lee Junan Kim Kyunghoon Burm Jinwook
Publisher: Taylor & Francis Ltd
ISSN: 1362-3060
Source: International Journal of Electronics, Vol.100, Iss.8, 2013-08, pp. : 1080-1091
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
A fast-locking PLL with all-digital locked-aid circuit
International Journal of Electronics, Vol. 100, Iss. 2, 2013-02 ,pp. :
Analysis and RHBD technique of single event transients in PLLs
By Zhiwei Han Liang Wang Suge Yue Bing Han Shougang Du
Journal of Semiconductors, Vol. 36, Iss. 11, 2015-11 ,pp. :