Enhancing matrix method to detect logic hazards

Author: Tan E. C.   Ho M. H.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3060

Source: International Journal of Electronics, Vol.82, Iss.4, 1997-04, pp. : 359-372

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract