Quantitative Analysis of Unique Deposition Pattern of Submicron Fe 3 O 4 Particles Using Computer-Controlled Scanning Electron Microscopy

Author: Jaques Peter A.  

Publisher: Taylor & Francis Ltd

ISSN: 1521-7388

Source: Aerosol Science and Technology, Vol.46, Iss.8, 2012-08, pp. : 905-912

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Abstract