Use of an atomic force microscope to measure surface deformations in polymeric systems

Author: Roggemann Michael C.   Williams John G.  

Publisher: Taylor & Francis Ltd

ISSN: 1568-5616

Source: Journal of Adhesion Science and Technology, Vol.16, Iss.5, 2002-05, pp. : 565-580

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract