Bimaterial curvature measurements for the CTE of adhesives: optimization, modeling, and stability

Author： Yu Jang-Horng   Guo Shu   Dillard David A.  

Publisher： Taylor & Francis Ltd

ISSN： 1568-5616

Source： Journal of Adhesion Science and Technology, Vol.17, Iss.2, 2003-02, pp. : 149-164

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