Quantitative FT-IR diffuse reflectance analysis of vinyl silanes on an aluminum hydroxide substrate

Author: Porro T.J.   Pattacini S.C.  

Publisher: Taylor & Francis Ltd

ISSN: 1568-5616

Source: Journal of Adhesion Science and Technology, Vol.6, Iss.1, 1992-01, pp. : 73-78

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Abstract