Prognostics of ceramic capacitor temperature-humidity-bias reliability using Mahalanobis distance analysis

Author: Nie Lei   Azarian Michael H.   Keimasi Mohammadreza   Pecht Michael  

Publisher: Emerald Group Publishing Ltd

ISSN: 0305-6120

Source: Circuit World, Vol.33, Iss.3, 2007-08, pp. : 21-28

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Abstract