Boundary scan based testing algorithm to detect interconnect faults in printed circuit boards

Author： Sharma D.K.   Sharma R.K.   Kaushik B.K.   Kumar Pankaj  

Publisher： Emerald Group Publishing Ltd

ISSN： 0305-6120

Source： Circuit World, Vol.37, Iss.3, 2011-08, pp. : 27-34

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