

Author: Sabariego R.V. Gyselinck J. Geuzaine C. Dular P. Legros W.
Publisher: Emerald Group Publishing Ltd
ISSN: 0332-1649
Source: COMPEL: Int J for Computation and Maths. in Electrical and Electronic Eng., Vol.22, Iss.3, 2003-09, pp. : 659-673
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content








By KAGAWA Y. YAMABUCHI T. KITAGAMI S.
COMPEL: Int J for Computation and Maths. in Electrical and Electronic Eng., Vol. 2, Iss. 4, 1993-12 ,pp. :


By Darabseh Tariq Alshaer Bassam Khrais Samir
International Journal of Computer Applications in Technology, Vol. 46, Iss. 2, 2013-02 ,pp. :