Author: Ioan Daniel Schilders Wil Ciuprina Gabriela Meijs Nick van der Schoenmaker Wim
Publisher: Emerald Group Publishing Ltd
ISSN: 0332-1649
Source: COMPEL: Int J for Computation and Maths. in Electrical and Electronic Eng., Vol.27, Iss.4, 2008-07, pp. : 820-829
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Learning mixtures of point distribution models with the EM algorithm
By Al-Shaher A.A. Hancock E.R.
Pattern Recognition, Vol. 36, Iss. 12, 2003-12 ,pp. :
Competitive EM algorithm for finite mixture models
Pattern Recognition, Vol. 37, Iss. 1, 2004-01 ,pp. :
Verification of integrated IDEF models
By Kacprzak Marek Kaczmarczyk Andrzej
Journal of Intelligent Manufacturing, Vol. 17, Iss. 5, 2006-10 ,pp. :