Visual detection of sub-surface defects using enhanced eddy current microscope

Author: Cheng Yu-hua   Jiang Shu-yan   Luo Gang  

Publisher: Emerald Group Publishing Ltd

ISSN: 0332-1649

Source: COMPEL: Int J for Computation and Maths. in Electrical and Electronic Eng., Vol.29, Iss.2, 2010-03, pp. : 347-354

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