Author： Glatzel Pieter de Groot Frank Bergmann Uwe
Publisher： Taylor & Francis Ltd
ISSN： 0894-0886
Source： Synchrotron Radiation News, Vol.22, Iss.2, 2009-03, pp. : 12-16
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
X-ray absorption spectroscopy (XAS) has become an indispensable tool in catalysis research. The instrumentation at synchrotron radiation sources as well as analysis and calculation of XAS has reached such a high level that this technique is now attractive to a very large user community. Standard XAS, however, cannot answer all questions and complementary techniques that address the electronic structure in more detail and help to investigate low Z elements as ligand or absorber add to the repertoire of hard X-ray techniques. We discuss in this contribution how energy analysis of the scattered photons [1] in addition to control of the incident photon energy (cf. Figure 1) extends the range of applications of XAS and addresses some problems that XAS cannot solve [2].
Related content
Access to resources
Recommend
Phase-contrast hard X-ray microscope with a zone plateat the photon factory
Le Journal de Physique IV, Vol. 104, Iss. issue, 2003-03 ,pp. :
Access to resources
Soft X-Ray Grating Monochromators at the Photon Factory
Le Journal de Physique IV, Vol. 7, Iss. C2, 1997-04 ,pp. :