Trends in X-ray Fluorescence Microscopy

ISSN： 0894-0886

Source： Synchrotron Radiation News, Vol.26, Iss.2, 2013-03, pp. : 32-38

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Abstract

Modern synchrotron-based X-ray fluorescence microscopy (XFM) has become a critical tool for many a research program, addressing extremely broad and highly relevant scientific questions. Their ability to map trace elemental content and probe local chemical state has been applied to numerous scientific areas in the life sciences [1–3], the environmental and earth sciences [4, 5], the materials sciences, as well as in cultural heritage studies. The newest generation of instruments utilizes high-brightness X-ray sources and incorporate state-of-the-art focusing optics and detector systems. Advances in X-ray sources and nanofocusing optics, for example, have allowed these instruments to achieve spatial resolutions of 20–30 nm using diffractive optics such as Fresnel zone plates and 200 nm using reflective optics such as Kirkpatrick-Baez mirrors. New beamlines, now in the design stage, aim to achieve similar (and better) resolutions within the next five years.