Planar array 3D electrical capacitance tomography

Author: Ye Z   Banasiak R   Soleimani M  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.55, Iss.12, 2013-12, pp. : 675-680

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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