Author: Häggström Olle Wästlund Johan
Publisher: Mathematical Association of America
E-ISSN: 0002-9890|120|10|893-900
ISSN: 1930-0972
Source: American Mathematical Monthly, Vol.120, Iss.10, 2013-12, pp. : 893-900
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Rigorous transmittance analysis of a sub-wavelength Sb thin film lens
By Zhou F. Gan X. Xu W. Gan F.
Applied Physics B, Vol. 84, Iss. 1-2, 2006-07 ,pp. :
Rigorous analysis of the electronic properties of InP interfaces for gas sensing
By Adamowicz B. Miczek M. Brun C. Gruzza B. Hasegawa H.
Thin Solid Films, Vol. 436, Iss. 1, 2003-07 ,pp. :
Foundations of Computational Mathematics, Vol. 4, Iss. 2, 2004-04 ,pp. :