Scanning Transmission X-Ray Microscopy: A New Method for the Investigation of Aggregation in Silica

Author: Beelen T.P.M.   Shi W.   Morrison G.R.   van Garderen H.F.   Browne M.T.   van Santen R.A.   Pantos E.  

Publisher: Academic Press

ISSN: 0021-9797

Source: Journal of Colloid and Interface Science, Vol.185, Iss.1, 1997-01, pp. : 217-227

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