Analysis of Admittance Data: Comparison of a Parametric and a Nonparametric Method

Author: Winterhalter J.   Ebling D.G.   Maier D.   Honerkamp J.  

Publisher: Academic Press

ISSN: 0021-9991

Source: Journal of Computational Physics, Vol.153, Iss.1, 1999-07, pp. : 139-159

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract