Multistable current-voltage characteristics a fingerprints of growth-related imperfections in semiconductor superlattices

Author： Schwarz G.   Patra M.   Prengel F.   Scholl E.  

Publisher： Academic Press

ISSN： 0749-6036

Source： Superlattices and Microstructures, Vol.23, Iss.6, 1998-06, pp. : 1353-1357

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