Scaling Structure Factor Amplitudes in Electron Cryomicroscopy Using X-Ray Solution Scattering

Author: Schmid M.F.   Sherman M.B.   Matsudaira P.   Tsuruta H.   Chiu W.  

Publisher: Academic Press

ISSN: 1047-8477

Source: Journal of Structural Biology, Vol.128, Iss.1, 1999-12, pp. : 51-57

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Abstract