

Author: Willems F.W. Muys W.
Publisher: Academic Press
ISSN: 1068-5200
Source: Optical Fiber Technology, Vol.2, Iss.1, 1996-01, pp. : 63-68
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content


By Yong Zhao Wanjun Wang Haifeng Shao Jianyi Yang Minghua Wang Xiaoqing Jiang
Journal of Semiconductors, Vol. 33, Iss. 1, 2012-01 ,pp. :






By Shigematsu M. Onishi M. Kashiwada T. Go H. Kakui M. Nishimura M.
Optical Fiber Technology, Vol. 2, Iss. 2, 1996-04 ,pp. :


Metrics for dispersion ripple in optical systems
By Hinton K.
Optical Fiber Technology, Vol. 10, Iss. 1, 2004-01 ,pp. :