Automatic particle picking from electron micrographs

By Lata K.R.   Penczek P.   Frank J.  

Ultramicroscopy, Vol. 58, Iss. 3, 1995-06 ,pp. : 381-391

Elsevier

Access to resources Recommend Favorite

Particle finding in electron micrographs using a fast local correlation algorithm

By Roseman A.M.  

Ultramicroscopy, Vol. 94, Iss. 3, 2003-04 ,pp. : 225-236

Elsevier

Access to resources Recommend Favorite

Effect of three-fold astigmatism on high resolution electron micrographs

By Krivanek O.L.   Stadelmann P.A.  

Ultramicroscopy, Vol. 60, Iss. 1, 1995-08 ,pp. : 103-113

Elsevier

Access to resources Recommend Favorite

Leginon: a system for fully automated acquisition of 1000 electron micrographs a day

By Potter C.S.   Chu H.   Frey B.   Green C.   Kisseberth N.   Madden T.J.   Miller K.L.   Nahrstedt K.   Pulokas J.   Reilein A.   Tcheng D.   Weber D.   Carragher B.  

Ultramicroscopy, Vol. 77, Iss. 3, 1999-07 ,pp. : 153-161

Elsevier

Access to resources Recommend Favorite

A fuzzy logic approach to image analysis of HREM micrographs of III-V compounds

By Hillebrand R.   Werner P.   Hofmeister H.   Gosele U.  

Ultramicroscopy, Vol. 66, Iss. 1, 1996-11 ,pp. : 73-88

Elsevier

Access to resources Recommend Favorite