Author： Ruiz-Torres Alex J. Zhang Jianmei Zapata Edgar Pennathur Arunkumar Rhodes Russell McCleskey Carey Cowen Marcella
Publisher： Emerald Group Publishing Ltd
ISSN： 0265-671X
Source： International Journal of Quality & Reliability Management, Vol.27, Iss.4, 2010-04, pp. : 486-504
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