Experimental Results on BIC Sensors for Transient Current Testing

By Picos R.   Roca M.   Isern E.   Segura J.   García-Moreno E.  

Journal of Electronic Testing, Vol. 16, Iss. 3, 2000-06 ,pp. : 235-241

Springer Publishing Company

Access to resources Recommend Favorite

Electro-thermal Stimuli for MEMS Testing in FSBM Technology

By Dumas N.   Azaïs F.   Latorre L.   Nouet P.  

Journal of Electronic Testing, Vol. 22, Iss. 2, 2006-04 ,pp. : 189-198

Springer Publishing Company

Access to resources Recommend Favorite

Thermal Testing of Analogue Integrated Circuits: A Case Study

By Altet J.  

Journal of Electronic Testing, Vol. 19, Iss. 3, 2003-06 ,pp. : 353-357

Springer Publishing Company

Access to resources Recommend Favorite

Transient Thermal Impedance Measurements on Low-Temperature-Sintered Nanoscale Silver Joints

By Mei Yunhui  

Journal of Electronic Materials, Vol. 41, Iss. 11, 2012-11 ,pp. : 3152-3160

Springer Publishing Company

Access to resources Recommend Favorite

A Two-Level Power-Grid Model for Transient Current Testing Evaluation: On-line Testing (Guest Editors: Cecilia Metra and Matteo Sonza Reorda)

By Alorda B.  

Journal of Electronic Testing, Vol. 20, Iss. 5, 2004-10 ,pp. : 543-552

Springer Publishing Company

Access to resources Recommend Favorite