Author: Shnawah Dhafer Abdul-Ameer Sabri Mohd Faizul Mohd Badruddin Irfan Anjum Che Fa Xing
Publisher: Emerald Group Publishing Ltd
ISSN: 1356-5362
Source: Microelectronics International, Vol.29, Iss.2, 2012-05, pp. : 108-116
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Abstract