Author: Nakasuji Mamoru Shimizu Hiroyasu
Publisher: Oxford University Press
ISSN: 0022-0744
Source: Journal of Electron Microscopy, Vol.45, Iss.5, 1996-10, pp. : 359-363
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Fukunaga Yuko Higashihara Ai Nishino Yuri Yasunaga Takuo Jin Mingyue Miyazawa Atsuo
Journal of Electron Microscopy, Vol. 61, Iss. 4, 2012-08 ,pp. :
Noise in secondary electron emission: the low yield case
By Frank Luděk
Journal of Electron Microscopy, Vol. 54, Iss. 4, 2005-08 ,pp. :