Author： Yamada S.
Publisher： Oxford University Press
ISSN： 0022-0744
Source： Journal of Electron Microscopy, Vol.46, Iss.1, 1997-01, pp. : 67-74
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Abstract
The defocus convergent-beam electron diffraction method has been used for the determination of the displacement vector of a stacking fault in the (101) plane of TiO2. The displacement vector has been determined to be [0.25±0.00, 0.00±0.03, 0.27±0.01]. High-resolution electron microscopy (HREM) images show that there is a relaxation of the lattice with a width of about 1 nm around the fault. A structural model of the fault with a relaxation is proposed, which explains the HREM images well.
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