STEMM, EELS, Z-contrast images, defects, Interfaces

Author: Browning D   Arslan I   Ito Y   James M   Klie F   Moeck P   Topuria T   Xin Y  

Publisher: Oxford University Press

ISSN: 0022-0744

Source: Journal of Electron Microscopy, Vol.50, Iss.3, 2001-05, pp. : 205-218

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Abstract