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Journal of Electron Microscopy, Vol. 54, Iss. 6, 2005-12 ,pp. : 493-496

Oxford University Press

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Automated characterization of bending and expansion of a lattice of a Si substrate near a SiGe/Si interface by using split HOLZ line patterns

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The structure of Si nanocrystals on SiC

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HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis

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