Automated characterization of bending and expansion of a lattice of a Si substrate near a SiGe/Si interface by using split HOLZ line patterns

By Saitoh Koh   Yasuda Yoshifumi   Hamabe Maiko   Tanaka Nobuo  

Journal of Electron Microscopy, Vol. 59, Iss. 5, 2010-10 ,pp. : 367-378

Oxford University Press

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Voltage refinement by deficit HOLZ line geometry

By Rossouw Chris J.  

Journal of Electron Microscopy, Vol. 53, Iss. 4, 2004-08 ,pp. : 381-392

Oxford University Press

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The influence of inclined surfaces on HOLZ reflections

By Spellward P.  

Journal of Electron Microscopy, Vol. 46, Iss. 2, 1997-01 ,pp. : 109-117

Oxford University Press

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Practical considerations on the determination of the accuracy of the lattice parameters measurements from digital recorded diffractograms

By Biskupek Johannes   Kaiser Ute  

Journal of Electron Microscopy, Vol. 53, Iss. 6, 2004-12 ,pp. : 601-610

Oxford University Press

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Phenotyping in the archaea: optimization of growth parameters and analysis of mutants of

By Jantzer Katharina   Zerulla Karolin   Soppa Jörg  

FEMS Microbiology Letters, Vol. 322, Iss. 2, 2011-09 ,pp. : 123-130

Blackwell Publishing

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