Author: Osawa T. Ishida2 K. Onodera1 M. Feng1 X-Y. Hayashi2 S. Nozaka1 Y.
Publisher: Oxford University Press
ISSN: 0022-0744
Source: Journal of Electron Microscopy, Vol.51, Iss.5, 2002-10, pp. : 341-345
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Abstract
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