HVEM study of crack-tip dislocations in Si crystals prepared by FIB and twin-blade cutting method

By Tanaka Masaki   Higashida Kenji   Fukui Toru   Yokote Tatsuo  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 505-509

Oxford University Press

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Formation of crystalline silicon in kaolinite by electron beam irradiation and in situ heating in the HVEM

By Lee Sujeong   Kim Young-Min   Kim Youn-Joong  

Journal of Electron Microscopy, Vol. 56, Iss. 4, 2007-08 ,pp. : 153-155

Oxford University Press

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Statoliths in Phycomyces: Characterization of Octahedral Protein Crystals

By Eibel P.   Schimek C.   Fries V.   Grolig F.   Schapat T.   Schmidt W.   Schneckenburger H.   Ootaki T.   Galland P.  

Fungal Genetics and Biology, Vol. 29, Iss. 3, 2000-04 ,pp. : 211-220

Elsevier

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Optimization of Operating Conditions for the FE Gun System of HVEM

By Morita Chiaki   Shimoyama Hiroshi  

Journal of Electron Microscopy, Vol. 45, Iss. 5, 1996-10 ,pp. : 372-379

Oxford University Press

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FIB/HVEM observation of the configuration of cracks and the defect structure near the cracks in Si

By Saka H.   Abe S.  

Journal of Electron Microscopy, Vol. 46, Iss. 1, 1997-01 ,pp. : 45-57

Oxford University Press

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