Local lattice parameter determination of a silicon (001) layer grown on a sapphire (11¯02) substrate using convergent-beam electron diffraction

By Akaogi Takayuki   Tsuda Kenji   Terauchi Masami   Tanaka Michiyoshi  

Journal of Electron Microscopy, Vol. 55, Iss. 3, 2006-06 ,pp. : 129-135

Oxford University Press

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Interferometry by Coherent Convergent-Beam Electron Diffraction

By Tsuda Kenji   Tanaka Michiyoshi  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 59-63

Oxford University Press

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Automated characterization of bending and expansion of a lattice of a Si substrate near a SiGe/Si interface by using split HOLZ line patterns

By Saitoh Koh   Yasuda Yoshifumi   Hamabe Maiko   Tanaka Nobuo  

Journal of Electron Microscopy, Vol. 59, Iss. 5, 2010-10 ,pp. : 367-378

Oxford University Press

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decagonal quasicrystal, high-angle annular dark-field imaging, Z-contrast imaging, convergent-beam electron diffraction

By Saitoh K  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 197-203

Oxford University Press

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Recent Advances in Quantitative Convergent Beam Electron Diffraction

By Saunders Martin   Midgley Paul   Vincent Roger   Steeds John  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 11-18

Oxford University Press

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