Amplitude-division three-electron-wave interference for observing pure phase objects having low spatial frequency

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.54, Iss.1, 2005-01, pp. : 51-55

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Direct observation of electrostatic microfields by four-electron-wave interference using two electron biprisms

By Miyashita Kimiya

Journal of Electron Microscopy, Vol. 53, Iss. 6, 2004-12 ,pp. : 577-582

Oxford University Press

Access to resources Recommend Favorite

Coherent electron interference from amorphous TEM specimens

By Herring Rodney A. Saitoh Koh Tanaka Nobuo Tanji Takayoshi

Journal of Electron Microscopy, Vol. 59, Iss. 5, 2010-10 ,pp. : 321-329

Oxford University Press

Access to resources Recommend Favorite

Three-dimensional electron microscopy of individual nanoparticles

By Jarausch Konrad Leonard Donovan N.

Journal of Electron Microscopy, Vol. 58, Iss. 3, 2009-06 ,pp. : 175-183

Oxford University Press

Access to resources Recommend Favorite

Noise in secondary electron emission: the low yield case

By Frank Luděk

Journal of Electron Microscopy, Vol. 54, Iss. 4, 2005-08 ,pp. : 361-365

Oxford University Press

Access to resources Recommend Favorite

Verrucomicrobia div. nov., a new division of the Bacteria containing three new species of Prosthecobacter

By Hedlund B.P. Gosink J.J. Staley J.T.

Antonie van Leeuwenhoek, Vol. 72, Iss. 1, 1997-07 ,pp. : 29-38

Springer Publishing Company

Access to resources Recommend Favorite