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Journal of Electron Microscopy, Vol. 54, Iss. 3, 2005-06 ,pp. : 287-291

Oxford University Press

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High energy-resolution electron energy-loss spectroscopy study of the electronic structures of Li- and Mg-doped α-rhombohedral boron

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High-resolution transmission electron microscopy and electron energy-loss spectroscopy study of polycrystalline-Si/ZrO 2 /SiO 2 /Si metal-oxide-semiconductor structures

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