Spectrographic Analysis of Hafnium By a Point-to-Plane Technique

Author: Brayer R. C.   O'Connell R. F.   Powell A. S.   Gale R. H.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.15, Iss.1, 1961-01, pp. : 10-13

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Abstract

A method has been developed for the analysis of hafnium metal for aluminum, copper, iron, titanium, and tungsten in the ppm range and zirconium in the 1 0-4.0% range. Solid machined pieces 1 × 1 in. or larger are used. Spectra are excited with a low voltage ignited ac arc with low inductance and capacitance. Hafnium serves as the internal standard. The method offers an increase in speed and improved precision over the carrier distillation technique which has been commonly used.