![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Nash D. L.
Publisher: Society for Applied Spectroscopy
ISSN: 0003-7028
Source: Applied Spectroscopy, Vol.22, Iss.2, 1968-03, pp. : 101-104
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Strzyzewska B. Radwan Z. Minczewski J.
Applied Spectroscopy, Vol. 20, Iss. 4, 1966-07 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Xu Yuyu Wang Hui Wang Guoxin Wu Cheng Zhou Jinfan
Applied Spectroscopy, Vol. 64, Iss. 5, 2010-05 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Radwan Z. Strzyzewska B. Minczewski J.
Applied Spectroscopy, Vol. 17, Iss. 3, 1963-05 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
A Method For the Determination of Trace Impurities
Applied Spectroscopy, Vol. 12, Iss. 2, 1958-05 ,pp. :