Author: Dieleman J. Witmer A. W. Ponsioen J. C. M. A. Damen C. P. T. M.
Publisher: Society for Applied Spectroscopy
ISSN: 0003-7028
Source: Applied Spectroscopy, Vol.27, Iss.5, 1973-09, pp. : 387-388
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
An Inexpensive Solid Sampling Technique for Infrared Studies
Applied Spectroscopy, Vol. 18, Iss. 6, 1964-11 ,pp. :
Emission Spectrographic Analysis of Tantalum Thin Films
By Nohe J. D.
Applied Spectroscopy, Vol. 21, Iss. 6, 1967-11 ,pp. :