The Use of Ratio-recording Interferometry for the Measurement of Infrared Emission Spectra: Applications to Oxide Films on Copper Surfaces

Author： Kember D. Sheppard N.

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.29, Iss.6, 1975-11, pp. : 496-500

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Applications of Multiple-Scan Interferometry to the Measurement of Infrared Spectra

By Low M. J. D.

Applied Spectroscopy, Vol. 22, Iss. 5, 1968-09 ,pp. : 463-471

Society for Applied Spectroscopy

Access to resources Recommend Favorite

Infrared Emission Spectra of Liquids in a Diamond Anvil Cell by Interferometry

By Lauer James L. Peterkin Melvin E.

Applied Spectroscopy, Vol. 29, Iss. 1, 1975-01 ,pp. : 78-79

Society for Applied Spectroscopy

Access to resources Recommend Favorite

Absorbance Ratio Calculations from the Infrared Spectra of Thick Liquid Films

By Cleverley Barry Dolby Rex

Applied Spectroscopy, Vol. 32, Iss. 2, 1978-03 ,pp. : 187-189

Society for Applied Spectroscopy

Access to resources Recommend Favorite

Recording Infrared Spectra for Quantitative Analysis

By Perry John A. Bain George H. Traver Ward B.

Applied Spectroscopy, Vol. 10, Iss. 4, 1956-11 ,pp. : 191-192

Society for Applied Spectroscopy

Access to resources Recommend Favorite

Infrared Emission Spectra of Solids

By Fabbri Gianfranco Baraldi Pietro

Applied Spectroscopy, Vol. 26, Iss. 6, 1972-11 ,pp. : 593-599

Society for Applied Spectroscopy

Access to resources Recommend Favorite